在設計仿真用例時,有限制條件的激勵相比漫無目的的仿真更加有效的找出RTL的bug。因此,同一份測試方案,不同的sequence往往代表著不同的test_case。真正的測試用例都是基于base_test派生的一個類。
2022-09-19 09:16:40
3173 Test point指的是在電路或芯片設計中特別添加的電路元件或邏輯,以便在測試時可以輕松地檢測電路的正確性。
2023-09-15 11:34:45
7407 
我買了夏宇聞老師的《Verilog 數字系統設計教程》(第四版)其中第114頁有一個例子,我想做這個實驗,可是不成功代碼為:// test vector input registersreg clk
2022-10-09 10:09:20
KEITHLEY - 2280-TEST-LEAD - POWER SUPPLY TEST LEAD KIT, 1KV, 20A
2024-06-20 20:52:22
test coupon 什么是test coupon
2009-09-06 08:43:35
往 serialinterface registers 中輸入數據。先填充哪個寄存器,以及高低位。
順便介紹一下: Deskew pattern, Sync patter,custom
2025-02-14 06:17:59
大家好,請教你們AFE5801的一個問題。AFE5801在配置了SPI讀使能之后,我讀出的地址到底是general-purpose registers的值還是TGC registers的值?因為這兩組寄存器的地址是重合的。到底怎么讀TGC registers寄存器組的值?
2025-02-11 07:54:30
A64指令集包括訪問system registers編碼空間的指令。這些指令有: Access to System registers, including the debug
2023-03-21 15:16:56
test pattern可以正常投圖,internal pattern無法投圖,LED不亮。
實測波形:internal pattern無法投圖時,LED_SEL_0和LED_SEL_1無波形
2025-02-21 07:22:23
is configured for Nano-TBCVHDL features.The controller will be software reset viaits registers
2020-11-17 16:32:10
如下圖所示,為AOT290L/AOB290L( N MOSET )的部分參數。其中,VGS(th)的值為:Min,2.9V ;Typ,3.5V;Max,4.1V .請教:我對VGS(th)參數
2017-08-10 00:15:55
PSoC_4_BLE_Registers_TRM
2017-09-26 12:25:18
關于SARADC模塊,請問Internal channel/Test channel/External channel的都有那些區別呢
,應用場景有何不同。Supervisor ADC和普通ADC怎么配合使用呢?
2025-03-12 07:34:53
madgwick_internal_report
2016-08-17 12:20:53
什么是DMB-TH?什么是DMB-TH DMB-TH(Terrestrial Digital Multimedia TV/Handle Broadcasting)是由清華大學和北京凌訊華業
2008-05-28 13:36:03
使用的是64PIN的28035,我想問一下使用Internal VREG和不使用Internal VREG有啥區別,在什么應用條件下Enable,什么條件下Disable。看了datasheet,還不是很清楚,希望大俠幫忙。謝謝
2020-06-11 11:10:36
`回收TH2817C二手同惠電橋TH2817C全國回收倒閉廠儀器工廠閑置儀器設備----------------------------------------東莞市佰福達儀器有限公司聯系人:譚先生
2018-11-19 11:14:08
`回收TH2818XC二手電橋同惠TH2818XC東莞市佰福達儀器有限公司聯系人:譚先生手機:***威信:sj15573551422業務咨詢QQ:465137525經營地址:廣東省東莞市塘廈鎮蓮湖
2018-11-19 11:09:40
`回收TH2819同惠電橋TH2819東莞市佰福達儀器有限公司聯系人:譚先生 手機:***威信:sj15573551422在線QQ:465137525地址:東莞市塘廈鎮清塘北街16號
2018-11-19 11:12:39
在STM8S-DISCOVERY的官方文檔里偶然看到,STVD是有Peripheral registers window來監視各個寄存器的數值的。雖說用STM32多,但是自己在debug時也沒找到這個窗口。。。下面是官方文檔里給出的那個窗口的截圖
2018-10-01 06:09:32
大家好我在定制板上使用Virtex 5的Tri模式EMAC核心。它工作正常,但我無法弄清楚如何訪問GENERAL ADDRESS REGISTERS(0到3)。我找到了UNICAST ADDRESS并添加了Host接口,但仍然沒有運氣。提前致謝
2020-06-10 15:18:15
我已經在電壓模式下設置了 POWERSTEP01 驅動器,效果很好。現在我想使用無傳感器失速檢測功能來實現無傳感器歸位。stall_th 和 ocd_th 值必須如何確定尺寸才能使其正常工作。比方說
2023-01-13 08:09:23
Hi TIers:Porting1.2 to1.32,set Number of virtual registers to 16。 virtual registers是什么,為什么要設置為16呢?
2020-08-28 09:52:26
Kenwood TH-G71A 對講機資料
2006-04-10 00:01:44
51 The purpose of this application note is to describe how to configure and use the internal
2009-01-23 23:17:38
18 304TH.pdf 電子管資料數據手冊
2009-08-12 10:57:02
7 3014 Reliability Test:Resistance Soldering Heat(Reflow Soldering)Test Conditions:Tsld =260+5℃ (3 times)(Standard : JEITA ED-4701 300-301)
2009-09-07 08:03:37
5 an internal precisionoscillator that provides all the necessary timing requiredfor driving each LED. Two prescaler registers alon
2009-09-30 08:49:20
11 an internal precisionoscillator that provides all the necessary timing requiredfor driving each LED. Two prescaler registers along
2009-09-30 09:16:44
13 IPC-TM-650 TEST METHODS MANUAL:Time domain reflectometry, TDR, is used to measure reflections
2009-10-17 17:27:43
103 TH2613X與TH2617X型多路電容器掃描測試系統
2009-11-16 17:14:24
13 Li-ion Battery Discharge Test Report:1. Li-ion battery dropout voltages test2. Li-ion battery
2009-11-20 14:55:09
16 iPod nano (4th generation) 使用手冊(中文說明書指南)
2009-11-23 08:58:35
47 時間繼電器TH3A設計電路
2009-11-26 11:47:36
25 LCD Test 下載 (測試軟件),一個小工具。測試方法:一運行就可以看到LCD液晶屏的整個問題。
2010-06-12 07:50:26
164 5th Worksh
2010-07-01 18:49:10
6 to address this requirement. One suchtechnique is that of wavelength division multiplexing (WDM). Thisproduct note addresses th
2010-07-09 15:53:10
20 The Agilent Technologies E4216A Frame Relay Test Software decodes and displays frames, as well
2010-07-09 15:58:47
6 DescriptionThe HP9421A Interface Test Adapter (ITA) providesconnections to and from the unit under
2010-07-09 17:36:56
8 The E4215B Internet Protocols Test Software application enables bi-directional functional IP
2010-07-09 17:52:27
12 IntroductionLatency, jitter, and throughput is oneof the test categories described inthe Evaluating
2010-07-09 18:02:11
5 Performancesolution note. This solution noteprovides a sample test plan andexpected results for this test category.
2010-07-09 18:04:22
7 proces-sor operation, download new soft-ware, and display or modify targetmemory or internal registers.
2010-07-10 10:29:56
12 The Agilent Technologies E5118A BSTS Switch-Router Test Solution provides the industry’s most
2010-07-13 09:55:32
14 The Agilent Technologies E5115A BSTS ATM Traffic Management Test Solution lets you comprehensively
2010-07-13 09:58:09
4 Agilent Technologies automated OSPF conformance test suite provides realistic internet-scale
2010-07-14 23:18:36
3 Agilent Technologies automated IS-IS conformance test suite provides realistic internet-scale
2010-07-14 23:22:36
6 Working at the forefront of technologyplaces demands on you and your test equipment.
2010-07-15 23:47:41
13 Agilent Technologies’ automated PIM-SM Conformance Test Suite is the ideal solution for network
2010-07-16 23:25:14
32 , and control circuitry arranged for multiplexed transmission of data directly from the input bus or from the internal registers. Data on the A or
2010-07-20 16:28:31
8 , and control circuitry arranged for multiplexed transmission of data directly from the input bus or from the internal registers. Data on the A or
2010-07-20 16:33:03
6 , and control circuitry arranged for multiplexed transmission of data directly from the input bus or from the internal registers. Data on the A or
2010-07-20 16:51:59
16 , and control circuitry arranged for multiplexed transmission of data directly from the input bus or from the internal registers. Data on the A or
2010-07-20 16:53:35
10 The Infiniium USB Test Optionprovides a fast and reliable way to verify USB electricalspecification
2010-07-22 14:05:37
20 , and control circuitry arranged for multiplexed transmission of data directly from the input bus or from the internal registers. Data on th
2010-07-22 16:10:44
17 test innovation, the Medalist VTEP hardware and software. It has been updated to include the latest Medalist iVTEP technology.
2010-07-29 08:44:57
23 Packard designed the first HPinstrument – the 200A audio oscillator. Our Test and Measurementorganization today makes hundreds
2010-08-02 10:50:07
12 CD4517B dual 64-stage static shift register consists of two independent registers each having a
2010-08-03 16:30:14
21 We can help you:■ Increase test throughput with 3X faster measurement speed and 2X faster data
2010-08-11 08:50:28
17 Agilent TestExec SL is a test execu-tive designed for high-volume, high throughput functional test
2010-08-17 12:35:22
6 TH系列PCIE接口反射內存定購信息TH-PCIe-110 128MB反射內存卡 多模光纖TH-PCIe-111 128MB反射內存卡 單模光纖
2024-09-03 14:53:22
TH系列PCI接口反射內存定購信息TH-PCI-110 128MB反射內存卡 多模光纖TH-PCI-111 128MB反射內存卡 單模光纖
2024-09-03 15:30:57
松下TH-42PHD5、TH-42PHW5等離子彩電開關電源電路
2009-01-22 23:40:02
929 
松下TH-42PHW6EX、TH-42PHD6EX、TH-42PHD6BX、TH-42PHD6UY等離子彩電開關電源電路
2009-01-22 23:40:41
943 
松下TH-65PHD8BK TH-65PHD8EK TH-65PHD8UK等離子彩電開關電源電路
2009-01-22 23:42:23
1069 
MAX17088 Internal-Switch Boost Regulator with High-Voltage Level Shifter for TFT LCDs
2009-03-23 22:04:19
849 Abstract: Application note 389 describes how to use the internal Bit Error Rate Test (BERT
2009-04-20 09:35:55
957 registers. In order to derive those functions, we need to use the test registers of the following devices: DS21Q42, DS21Q44, DS2152, DS2154, D
2009-04-20 10:48:32
1246 
—manual testing—to the most complex—large-scale automatic test equipment (ATE). In between simple manual testing and large-scale ATE l
2009-04-20 16:26:11
1323 
—manual testing—to the most complex—large-scale automatic test equipment (ATE). In between simple manual testing and large-scale ATE l
2009-04-21 11:53:36
1005 
Linear feedback shift registers are introduced along with the polynomials that completely describe
2010-07-04 12:20:39
1396 
KENWOOD TH28電路圖:
2012-02-28 15:17:31
165 ESP-Test Board測試板原理圖,PCB 文件, BOM 清單
2015-12-30 14:51:46
12 基于EPM240的入門實驗modelsim_test
2016-01-21 11:25:02
13 UWB通信系統的TH-PPM信號產生與接收研究,UWB通信系統的TH-PPM信號產生與接收研究
2016-03-01 10:08:19
35 Test Control Window.多種集合,符合熱愛PCB繪圖的學習者的胃口,喜歡的朋友下載來學習。
2016-03-21 15:19:24
0 Test Keyboard.多種集合,符合熱愛PCB繪圖的學習者的胃口,喜歡的朋友下載來學習。
2016-03-21 15:18:35
0 Test Palette Window多種集合,符合熱愛PCB繪圖的學習者的胃口,喜歡的朋友下載來學習。
2016-03-21 15:17:42
0 Test BarLed Window.多種集合,符合熱愛PCB繪圖的學習者的胃口,喜歡的朋友下載來學習。
2016-03-21 15:13:59
0 LPC1768_RTC_test11源代碼
2016-06-07 10:41:41
12 1768_UART_Test源代碼,下來看看
2016-06-07 10:41:41
13 MIPI+Test+Solutions+Overview_Webinar
2016-07-22 15:31:13
36 基于EP1C3的進階實驗sdr_test
2016-10-27 18:20:05
6 基于EPM240的入門實驗modelsim_test
2016-11-18 15:46:20
0 PSoC 5LP Registers TRM
2017-10-10 10:49:35
7 魅族16th高清拆解圖賞
2018-12-31 09:13:00
6333 買魅族16th還是小米8?作為兩款同樣采用高通驍龍845移動平臺的國產旗艦,魅族16th和小米8不免會被消費者們拿來進行比較。那么,魅族16th和小米8哪個更好一些?是該買魅族16th還是小米8呢?針對上述問題,小編今天為大家帶來了小米8和魅族16th對比評測。
2019-07-19 09:11:05
10720 什么是通孔? 通孔( TH )是多種名稱的孔 - 通孔,通孔,通孔,鍍通孔等 - 通孔( TH )是 PCB 上的孔,可以一直鉆孔,擴孔或銑削。這意味著,如果您猜測圖像中心的孔是 TH ,那是
2020-11-08 21:24:02
8040 TH222A實驗板資料手冊免費下載。
2022-07-01 09:28:46
1 同惠數字電橋TH2827系列是具有多種功能和更高測試頻率的新型LCR數字電橋,體積小緊湊便攜,便于上架使用。TH2827A/TH2827B/TH2827C數字電橋測試儀基本精度為0.05%,測試頻率
2022-11-25 16:47:49
1736 
Transient Load Test Board 原理圖
2023-03-14 19:48:35
0 NR4211TH 數據表
2023-04-04 19:24:14
0 Transient Load Test Board 原理圖
2023-07-05 20:15:03
2 NR4211TH 數據表
2023-07-14 18:57:39
0 北匯信息基于與OEM及Tier1的合作,結合自身的經驗積累,為供應商提供涵蓋國內及Global OEM需求的第三方測試認證服務Test-House。
2022-07-19 16:44:30
1566 
pkgs-test作為一個可以在github actions上面運行檢查軟件包編譯情況的工具,同時也可以在本地使用。
2023-09-21 15:00:41
1369 pkgs-test是一個可以在github actions上面檢查軟件包編譯情況的工具。除了檢查軟件包的編譯情況pkgs-test目前還添加了qemu運行測試。
2023-09-25 16:19:34
1444 同惠電子的TH2810與TH2830系列LCR數字電橋均為高精度阻抗測試儀器,廣泛應用于電子元器件檢測、科研實驗及生產線質量控制。本文從核心參數、功能特性及適用場景三個維度對比二者技術差異,為選型提供參考。
2025-10-18 10:01:35
1491 
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