高密度封裝技術推動測試技術發展
鮮 飛（烽火通信科技股份有限公司,湖北 武漢 430074）
摘要：高密度封裝技術的飛速發展也給測試技術提出了新挑戰。為了應對挑戰，新的測試技術不斷涌現。本文主要介紹了幾種新型測試技術的特點，并對未來測試技術的發展趨勢及方向進行了初步分析。
關鍵詞：集成電路；封裝；測試技術；自動光學檢測技術；自動X-射線檢測
Testing Technology Development Promoted by HDI Packaging Technology
XIAN Fei（Fiberhome Telecommunication Technologies Co.,Ltd, Wuhan 430074,China）
Abstract: The rapid development of high density packaging technology has already bring up the ew challenge to testing technology. For replying challenge, the new testing technology
continuously appears. Characteristics of several advanced testing technology are introduced in the
paper. The up-to-date trends are discussed and the future research directions are suggested.
Key words: IC; Package; Testing Technology; AOI; AXI