SD NAND可靠性驗證測試的重要性
SD NAND可靠性驗證測試至關重要。通過檢驗數據完整性、設備壽命、性能穩定性,確保產品符合標準,可提高產品的可信度、提高品牌聲譽,減少維修成本,確保產品質量和市場競爭力。
MK-米客方德是一家做存儲的公司,是SD NAND技術的引領者,工業應用的領導品牌。其公司SD NAND產品都有可靠性驗證測試報告,
SD NAND可靠性驗證測試報告
以MK-米客方德工業級SD NAND的MKDN064GCL-ZA型號為例,下面是可靠性驗證測試的具體項目。
『Test Summary』
No | Test Item | Description | Result |
1 | Card Density Check | 90% | Pass |
2 | Performance Test | HDBench/CrystalDiskMark/H2test | --- |
3 | Compliance Test | TestMetrix VTE3100/VTE4100 | Pass |
4 | Speed Class Test | TestMetrix VTE3100/VTE4100 | Pass |
5 | Full Size Copy/Compare | H2test | Pass |
6 | Burn-in Test | BIT @-25~ 85’C | Pass |
7 | NPOR Test | Normal power cycle test when card is stand by | Pass |
8 | SPOR Test | Sudden power cycle test when card is busy | Pass |
9 | Read Only Test | H2test | Pass |
10 | IR-Reflow | 260 ’C, check SLC data | Pass |
11 | Power consumption | Write & Read current measurement | --- |
Test Item
- Card DensityCheck
| Test Tool & Environment |
|
| Sample Quantity | 1ea |
| Result | 7374MB, 90% |
- PerformanceTest
- HDBench / CrystalDiskMark / IOMeter /H2test
Test Tool & Environment |
|
| Test Criteria | Depends on customer criteria |
| Sample Quantity | 2ea |
| Result | Pass (see 2.4 performance data) |
Test Tool & Environment | 1. IO Meter 2006.07.27
|
| Test Criteria | Depends on customer criteria |
| Sample Quantity | 2ea |
| Result | Pass (see 2.4 performance data) |
| Test Tool & Environment | 1. TestMetrix VTE3100/VTE4100 |
| Test Criteria | Depends on customer criteria |
| Sample Quantity | 3ea |
| Result | Pass (see 2.4 performance data) |
- Performance Data
Test Item | Test Mode | Result |
HDBench (100MB) | Sequential Read (MB/s) | 46.2 |
Sequential Write (MB/s) | 24.2 | |
CrystalDiskMark (100MB) | Sequential Read (MB/s) | 47.5 |
Sequential Write (MB/s) | 26 | |
IOMeter (100MB) | Random Write (IOPS) | 572.6 |
Random Read (IOPS) | 1119.5 | |
TestMetrix | Sequential Read (MB/s) | 24.4 |
Sequential Write (MB/s) | 10 | |
H2test | Sequential Read (MB/s) | 40.6 |
Sequential Write (MB/s) | 10 |
- ComplianceTest
| Test Tool & Environment | TestMetrix VTE3100/VTE4100 |
| Test Criteria | Test done without error |
| Sample Quantity | 3ea |
| Result | Pass |
- Speed ClassTest
| Test Tool & Environment | 1. TestMetrix VTE3100/VTE4100 |
| Test Criteria | Pass class 6 condition |
| Sample Quantity | 3ea |
| Result | Pass |
Speed Class | Test Mode | Result |
Class6 | Pw (MB/s) | 8.5 |
Pr (MB/s) | 9.6 |
- Full SizeCopy/Compare
Test Tool & Environment |
|
| Test Criteria | Test done without no error |
| Sample Quantity | 2ea |
| Result | Pass |
- Burn-in Test
BIT v8.0
Test Tool & Environment |
|
| Test Criteria | 168hours without error @25/85/-25’C |
| Sample Quantity | Total 6ea |
| Result | Pass |
- NPORTest
| Test Tool & Environment | 1.MK NPOR Tool |
| Test Criteria | Pass 10K cycles |
| Sample Quantityv | 2ea |
| Result | Pass |
- SPOR
- SPORTest1
| Test Tool & Environment | 1.MK SPOR Tool – 5%/95% non-file system |
| Test Criteria | Pass 10K cycles |
| Sample Quantity | 2ea |
| Result | Pass |
- SPORTest2
| Test Tool & Environment | 1. Specific SPOR Tool – small/large file system based |
| Test Criteria | Pass 10K cycles |
| Sample Quantity | 2ea |
| Result | Pass |
- Read OnlyTest
Test Tool & Environment |
|
| Test Criteria | 72hours without error |
| Sample Quantity | 4ea |
| Result | Pass |
- IR-reflow
| Test Tool & Environment | IR-reflow 260 ‘C |
| Test Criteria | 3 times test and check all data without error |
| Sample Quantity | 10ea |
| Result | pass |
- Powerconsumption
Test Tool & Environment |
| |||
Item | Standby current(uA) | Operating current (mA) | Throughput (MB/s) | |
#1 | 210 | Read | 96 | 47.6 |
Write | 81 | 26.6 | ||
#2 | 211 | Read | 95 | 47 |
Write | 83 | 26.8 | ||
#3 | 210 | Read | 96 | 48 |
Write | 81 | 27 | ||
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